2008 - ISO, IEC, NIST and OECD Workshop
ISO, IEC, NIST and OECD International workshop on documentary standards for measurement and characterization for nanotechnologies NIST, Gaithersburg, Maryland, USA 26 – 28 February 2008
ISO, IEC, NIST and OECD 26 – 28 February 2008.pdf
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